DOI:10.29111/ijlrst ISRA Impact Factor:3.35
Research Paper Open Access
International Journal of Latest Research in Science and Technology Vol.3 Issue 3, pp 228-233,Year 2014
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Received : 29 May 2014; Accepted : 12 June 2014 ; Published : 30 June 2014
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In this paper we will obtain a set of prepared sample images under different conditions, and with different physical properties. These images will be analyzed using the Grid Model (GM). The model starts by converting the prepared sample images (gray scale or colored images) to a two dimensional data files (*.dat) using programming. The 2D data file will be converted to 3D data file using FORTRAN programming. All images will be subjected to the generate filter algorithm for the 3D data file. After filtering the 3D data file we can establish histogram, contours and 3D surface to analyze the image. Another technique will be prepared using Visual FORTRAN for GM, which gives the vector map for the obtained data. In the paper we have proved that, any part from any image can be analyzed without reanalyzing the whole image, all sizes of the images are applicable, three samples with different sizes (256 * 256), (400 * 400), and (510 * 510) are taken (any other sizes are welcome). This method decreases the cost of hardware and sampling.
Copyright © 2014 M. A. Ashabrawy et al. This is an open access article distributed under the Creative Commons Attribution 4.0 International (CC BY 4.0) license which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
M. A. Ashabrawy,N. M. A. Ayad , " Using Grid Model For Nano Measurements Images ", International Journal of Latest Research in Science and Technology . Vol. 3, Issue 3, pp 228-233 , 2014
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